Semiconductor Measurement Systems
C-V Plotters: MDC manufactures the widest variety of C-V and I-V plotting systems available. The CSM/Win Semiconductor Measurement System family includes over one hundred different instrument configurations.
- Production C-V measurement
- MOS C-V measurement and analysis
- MOS conductance measurement and analysis
- MOS doping profile analysis
Mercury Probe: Mercury Probes are precision instruments that enable rapid, convenient, and non-destructive measurements of semiconductor samples by probing wafers with mercury to form contacts of well-defined area.
- Dot contact diameter: Nominally .030″ (760 micrometers).
- Repeatability of contact area: 1.1 %.
- Area ratio : Ring contact : Dot contact : : 48.6 : 1.
- Contact spacing: Nominally .015″ (400 micrometers).
Cryogenic Probe Station: Model 441 Cryogenic Probe Station is a cost effective alternative to high-priced vacuum based cryogenic probe stations. With up to five probes available and sample diameters up to six inches.
- Cold chuck chilled by liquid nitrogen
- Probe platen moves all probes at once.
- Computer controllable lamp for inversion stabilization.
- Choice of chuck sizes, and probe configurations.
Automatic Mapping Four Point Probe System: Materials Development Corporation offers the complete line of Four Point Probe systems from AIT. Systems are available to measure up to 12″ diameter (300 mm) wafers as well as specialty systems for Photovoltaic wafers and substrates
- Measuring range: 1 mohm/sq. to 2 Mohm/sq
- Resistivity Measuring range : 10.0 µohm·cm to 200.0 Kohm·cm
- Measurement Accuracy: ± 0.5 % (Standard Wafer, When at 23°C)
Nuclear Lab Kit
CANBERRA has packaged a set of 12 experiments, focusing on various aspects
of gamma-ray detection and analysis, which provides an understanding of basic principles to
more complex nuclear physics applications.
- Two types of kits – Basic & Advanced Model.
- With Basic kit can demonstrate 5 experiments
- With Advanced kit can demonstrate 12 Experiments.
Basic Hot Chuck System: Model _490 is Complete set of components required for mobile ion measurements by conventional bias-temperature stress technique (CVBT) or triangular voltage sweep method (TVS) using the MDC QuietCHUCK DC Hot Chuck Controller.
- Noise-free measurements.
- Microprocessor based PID temperature controller for precise temperature setting.
- Enables mobile ion measurements using CVBT or TVS.
Reference Wafer: Model RW10 combines capacitors, resistors, MOS devices, and a junction device in a wafer-like configuration. The RW10 enables the rapid verification of operation for capacitancevoltage and current-voltage instrumentation.
- Calibration certificate for RW wafers.
- Includes all capacitance and resistance values.
- Includes capacitance-voltage plots of the MOS.
- P- and N-MOS Capacitor.
- rapid verification of operation.